Testability
- Y. Zhang, L. S. Heck, M. T. Moreira, D. Zar, M. A. Breuer, N. L. V. Calazans, P. A. Beerel. “Testable MUTEX Design,” IEEE Transactions on Circuits and Systems I , vol. 63, No. 8, Aug. 2016.
- Y. Zhang, L. S. Heck, M. T. Moreira, D. Zar, M. A. Breuer, N. L. V. Calazans, P. A. Beerel: Design and Analysis of Testable Mutual Exclusion Elements. ASYNC 2015: 124-131
- P. A. Beerel and T. H.-Y. Meng, Semi-modularity and Testability of Speed-Independent Circuits, Integration, The VLSI Journal, pp. 301-322. Sep. 1992.
- P. A. Beerel and T. H.-Y. Meng, Testability of Asynchronous Self-Timed Control Circuits with Delay Assumptions, DAC-91, June 1991.
- P. A. Beerel and T. H.-Y. Meng, Semi-modularity and Self-Diagnostic Asynchronous Circuits,ARVLSI-91, March 1991.